Polarized-ligth microscope Zeiss AxioImiger A2m with Abrio attachment for imaging of optical textures, birefringence mapping etc. Temperature hot stage enables measurements in the range of 20-300C. Observations possible in transmission and reflection modes. The Abrio adapter allows for measurements of optical retardation in pixels ~2×2 micromiter.
Wide angle X-ray diffractometer Bruker GADDS with 2D detector Vantec 2000, radiation source microfocus-type with Cu anode (1.54A)
Small angle X-ray diffractometer (SAXS) Bruker Nanostar, radiation source microfocus-type with Cu anode (1.54A), detector Vantec 2000, structures with periodicity from 15A to 300A can be detected, also measurements of X-ray scattering can be performed
X-ray diffractometer with line and point detectors Bruker D8-Discover for diffraction and X-ray reflectometry measurements
Impedance analyzer Solartron SI1260 for measurement of dielectric permittivity and conductivity in the range of 30mHz – 30MHz. System equipped with Nicon polarized ligth microscope.
Differential scanning microcalorimeter TA DSC Q200 for measurements of thermal effects associated with phase transitions in the range from -80 to 400 C.
Optical system for measuring photoconductivity using the time-of-flight method and 'second harmonic generation’ setup, based on Ekspla picosecond laser
